- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 20/00 - Monitoring the movement or position of the probe
Patent holdings for IPC class G01Q 20/00
Total number of patents in this class: 87
10-year publication summary
7
|
12
|
12
|
8
|
11
|
1
|
3
|
5
|
1
|
1
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Bruker Nano, Inc. | 334 |
13 |
Hitachi High-Tech Science Corporation | 326 |
4 |
Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2362 |
4 |
Infinitesima Limited | 62 |
3 |
General Electric Company | 18133 |
2 |
Shimadzu Corporation | 5791 |
2 |
National University Corporation Kanazawa University | 243 |
2 |
Park Systems Corp. | 27 |
2 |
The Penn State Research Foundation | 1423 |
2 |
SensApex Oy | 16 |
2 |
UT-Battelle, LLC | 1333 |
2 |
Zyvex Labs, LLC | 17 |
2 |
Paris Sciences et Lettres - Quartier Latin | 170 |
2 |
Sorbonne Universite | 1068 |
2 |
The Regents of the University of California | 18943 |
1 |
International Business Machines Corporation | 60644 |
1 |
Centre National de La Recherche Scientifique | 9632 |
1 |
Koninklijke Philips Electronics N.V. | 13133 |
1 |
Caterpillar Inc. | 8877 |
1 |
Massachusetts Institute of Technology | 9795 |
1 |
Other owners | 37 |